...
09.13.06
TREK, Inc. of Medina, NY has unveiled its Model 325 Electrostatic Voltmeter, an ultra-sensitive meter ideal for noncontacting electrostatic voltage measurement and monitoring within high-tech, semiconductor, materials processing, materials science and R&D sectors. The Model 325 has been specifically designed for highly accurate, low noise, non-contacting measurement of electrostatic voltages (from millivolts to ±40 V) over a wide range of probe-to-surface distances. It also includes features such as sensitivity of 1 mV, speed of response less than 3 ms and accuracy better than .05% of full scale. TREK’s patented low impedance probe sensor assures measurement essentially independent of probe-to-test-surface spacing while eliminating the effects of high humidity and airborne contamination on measurement accuracy. The Model 325 offers faster response times, lower noise and higher accuracy than previous models. With a smaller probe to increase the unit’s ease of use in space-constrained environments, the Model 325 was designed to address the demanding semiconductor parameters for permittivity, oxide thickness and integrity, contact potentials and higher-speed automated voltage profile scanning. Special features of the Model 325 allow tuning the performance of the unit to compensate for specific test conditions. Model 325 can be operated as a bench top unit or in a standard rack (with optional hardware).
More info: (800) 367-8735; www.trekinc.com